ISO 04892-2-2013 amd1-2021.docx

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1、INTERNATIONA1.STANDARDISO4892-2ThirdeditionAME岫碓的1I2021-08P1.astics-Methodsofexposureto1.aboratory1.ightsources一杜利艺-arc1.ampsAMENDMENT1:C1.assificationofday1.ightSUifE曷一Methodesd,expositionadessourcesIumineusesdeIaboratoirePartie2:1.ampesarcauxnonAMENDEMENT1:C1.assificationdesfi1.tresdeIaIumieredujo

2、urReferencenumberISO4892-2:2013/Amd.1.:2021(E)OISO2021COPYRIGHTPROTECTEDDOCUMENTISO2021A1.1.rightsresened.Un1.motherwisespecifie1.rrequiredinthecontextofitsimp1.ementation,nopartofthispub1.icationmaybereproducedoruti1.izedot1.rwbeinanyformorbyanynease1.ectronicormechanica1.Indudingphotocopying,orpos

3、tingontheinternetoranintranet,withoutpriorwrittenpermission.PermissioncanherequestedfromeitherISOatthAddrrssbe1.owOr1.sOXSmemberbodyinthecountryoftherequester.ISOcopyrightofficeCP401Ch.deB1.andonnet8CH-1214Vernier,GenevaPhone：M1.22749O1.11嬲犒牌崎媲餐呼Pub1.ishedinSwitzerhndForewordthrough(ISOmittees,worko

4、fpreparingbodyInternationa1.Standardsisnorma1.1.ytechnica1.e1.ectrotechnica1.standardization.Internationa1.E1.ectrotechnica1.Commission(IEC)ona1.1.mattersofdifferenttypesofISOdocumentsshou1.dhenoted.ThisdocumentwasdraftedinaccordancewiththeAttentionisdrawntothepossibi1.itythatsomeofthee1.ementsofthi

5、sdocumentmaybethesubjectofAnytradenameusedinthisdocumentisinformationgivenfortheconvenienceofusersanddoesnotWor1.dTradeOrganization(WTO)princip1.esintheTechnica1.BarrierstoTrade(TBT)1seewww.iso.org/Igeingdocumentwasenvironmenta1.resistance,co1.1.aborationwithP1.asticsSubcommitteeSCforA1.istofa1.1.pa

6、rtsintheISO4892seriescanbefoundontheISOwebsite.O2021-A1.1.rightsreservedISO(theInternationa1.OrganizationforStandardization)isawor1.dwidefederationofnationa1.standardsbodiesmemberbodies).TheEachmemberinterestedinsubjectforwhichcarricommitteehasbeenestab1.ishedhastherighttoberepresentedonthatcommitte

7、e.Interorganizations,governmenta1.andnon-governmenta1.in1.iaisonwithISO,a1.sotakepartint1.ISOco1.1.aboratesc1.ose1.ywithTheproceduresusedtodeve1.opthisdocumentandthoseintendedforitsfurthermaintedescribedintheISO/iECDirectives,PartIJnparticuIar,thedifferentapprova1.criterianeededfortheeditoria1.ru1.e

8、softheISO/IECDirectives,Part2(seewww.iso.org/directives).patentrights.ISOsha1.1.notbehe1.dresponsib1.eforidentifyinganyora1.1.suchpatentrights.Detai1.sofanypatentrightsidentified(Iuringthedeve1.opmentCehG40um9Uwi1.1.beintheIntroductionand/oHiontheISO1.istofpatentdec1.arationsreceived(secwww.iso.org/

9、patents).constituteanendorsementForanexp1.anationofthevo1.untarynatureofstandards,themeaningofISOspecificteexpressionsconformityassessmentwe1.1.informationabout-ISO-adherenceiso/foreword.htm1.Thischemica1.andpreparedbyTechnica1.inCommittee1SOTC61,the,EuropeanComnStandardization(CEN)Technica1.Committ

10、eeCEN/TC249,P1.astics,inaccordancewiththeAgreementontechnica1.cooperationbetweenISOandCEN(ViennaAgreement).Anyfeedbackorquestionsonthisdocumentshatinna1.standardsbody.Acomp1.ete1.istingofthesebodiescanbefoundatwww.iso.org/members.htm1.P1.asticsMethodsofexposureto1.aboratory1.ightsources匐M*arc1.ampsA

11、MENDMENT1:C1.assificationofday1.ightfi1.ters4.1.2Addanewparagraphasfo1.1.ows:AnnexCdifferentiatesbetweentwodifferenttypesofday1.ightfi1.ters:TypeIandType11.Bothtypesfa1.1.underthere1.ativespectra1.irradiancerequirementsofxenon-arc1.ampswithday1.ightfi1.tersgiveninTab1.etAnnexCAddthefo1.1.owingnewAnn

12、exC:AnnexC(informative)C1.assificationofday1.ightfi1.tersC.1.MotivationThere1.ativespectra1.irradiancerequirementsforxenon-arc1.ampswithday1.ightfi1.tersa1.1.owabroadsystemsUVcut-onwave1.engths.However,avai1.ab1.efi1.terscanbegroupedintwomainspectra1.specifications,bothfu1.fi1.1.ingtherequirementsof

13、MethodA.Bygivingadditiona1.informationonthetypeoftheusedday1.ightfi1.ter,amucreproducibi1.ityandcomparabi1.ityofresu1.tscanbeachieved.Iftheinformationonthetypeoffi1.terisavai1.ab1.e,itisstrong1.yrecommendedtoaddthisinformationinthetestreport.WhenperformingMethodA,anyoptica1.fi1.tersmaybeusedthatfu1.

14、fi1.therequirementsinT;Thisistrueevenifthefi1.tersdonotfu1.fi1.theTypeIorTypeI1.specifications(seeTab1.eC.1.),orifsuchinformationisnotavai1.ab1.e.NOTEReproducib1.eresu1.tsaremore1.ike1.yachieved,ifsetups(instrumentandoptica1.system)withTypeIfi1.tersystemsarccomparedwithother,ypcIsetups,andTypeI1.set

15、upsareon1.ycomparedwithOthcrTypcI1.setups.C.2TypeIandTypeIIspecicationsThespectra1.irradianceofxenon-arc1.ampswithday1.ightfi1.tersaccordingtoTab1.e1isredefin20nmincrementsandsp1.itintotwotypes.InTab1.eC.1.,theorigina1.va1.uesarereferredtoasgenera1.day1.ight.TypeIdefinesoptica1.fi1.tersystemswithahi

16、gherUVcut-oncomparedtoTypeII.FigureC.1.showsexamp1.esofTypeIandTypeI1.fi1.tersystemsinthespectra1.rangefrom280nmtctogetherwithareferencespectrumaccordingtoISO/TR17801.TypeIandTypeI1.OPtieaIsjcoverthefu1.1.rangeofthespectra1.irradiancerequirementsinTab1.e1.TheUVcutonwave1.engthofTypeIfi1.tersisdosert

17、othecutonofthenatura1.g1.oba1.so1.arradiation.NOTE1IfTypeIIfi1.tersareused,fastermate11a1.degradationistypica1.1.yobserved.NOTE2ISO/TR17801containsareca1.cu1.atedreferencespectrumbasedonCIENo.85:1989,Tab1.e4.Thspectrumisinincrementsofaha1.fnanometerintheUVregion,andinincrementsofonenanometerfor1.ong

18、erwave1.engths.Tab1.eC.1Re1.ativespectra1.irradianceofxenon-arc1.ampswithday1.ightfi1.ters(method)aSpectra1.passbandwave1.engthGenera1.bTypeFTypeIf1CIENo.85:1989,Tab1.e40taM0nntaMItaXtttodBc2feaipIHMn!m射nk*5me同工id瞬世BjCi9血m8，Detai1.snfthesnhrreferencespectrumcanbefoundinTabk1.Yspectra1.irradianceW(mz

19、nm)1ISO/TR17801(CIE85：1989.Tab1.e4)2 TypeI3 TypeI1.NOTEThespectra1.irradiancedistributionisnorma1.izedto60W/mzinthepassbandfrom300nm400nm.FigureC.1.Representativespectra1.irradiancedistributionofxenon-arc1.ampswith*ype1andTyPeI1.day1.ightfi1.tersandthereferenceso1.arspectrumaccordingtoISO/TR17801Bib1.iographyAddthefo1.1.owingreferences:6)/rtSftiWWfiSAo11f27?ftWKffbrAcce1.eratedExposureOfAu1.omotiveExteriorMateria1.sICS83.080.011.1ricebasedon4pages